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Now downloading free:Agilent 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410

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Keysight Technologies Magnetic Force Microscopy Studies Using Keysight 7500 AFM Application Note Introduction Magnetic force microcopy (MFM) is a mode derived from AFM for probing mechanical properties of materials. The key requirement of this technique is the separation of the response caused by long-range magnetic interactions from the response due to short-range topographic interactions. In order to achieve that, MFM is operated in a two-pass way. A irst scan is taken to obtain the surface morphol- ogy, followed by positioning the magnetized tip at a certain distance above the sample. Qualitative mapping of a sample's magnetic domains is obtained in the second pass (phase image) by guiding the tip along the surface contour acquired in the irst scan. Magnetic media is commonly used to store data. This application brief presents a few ex- amples of examining material's magnetic properties of data storage devices as well as some other materials using the Keysight Technologies, Inc. 7500 atomic force microscope. 02 | Keysight | Magnetic Force Microscopy Studies Using Keysight 7500 AFM - Application Note Identifying Magnetic Domains Using MFM Imaging The irst sample selected in our MFM stud- ies is the traditional Sony Hi8 video tape. Shown in Figure 1 are both topography and simultaneously collected MFM images that could be routinely acquired from this mate- rial. In contrast to the surface morphology that only exhibits a smooth background in conjunction with many randomly distrib- uted nanoparticles, long-range zigzag patterning of magnetic domains are clearly resolved in the MFM data. Furthermore, it is worthy to point out that a few surface Figure 1. MFM imaging of Sony Hi8 video tapes. Both topographic image (left) and the corresponding contamination locations (i.e., those protru- MFM image (right) are acquired simultaneously. Scan size: 20



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